K.A., M., A.U., M. and H.T., S. 2019. Structural Characterization of RF-Sputtered CZTS Thin Films. International Journal of Advances in Scientific Research and Engineering (IJASRE), ISSN:2454-8006, DOI: 10.31695/IJASRE. 5, 9 (Sep. 2019), 149–155. DOI:https://doi.org/10.31695/IJASRE.2019.33481.