SULU H.T; MOREH A.U; ILIYASU M.I; ABUBAKAR M.B; AINA A.O; MUSTAPHA K. A; SULYMAN. A. Experimental Study on Effects of Film Thickness on Structural Characteristics of ITO Thin Film Prepared by RF Sputtering . International Journal of Advances in Scientific Research and Engineering (IJASRE), ISSN:2454-8006, DOI: 10.31695/IJASRE, [S. l.], v. 7, n. 12, p. 1–8, 2021. DOI: 10.31695/IJASRE.2021.34107. Disponível em: https://ijasre.net/index.php/ijasre/article/view/1412. Acesso em: 23 nov. 2024.