K.A., M.; A.U., M.; H.T., S. . Structural Characterization of RF-Sputtered CZTS Thin Films. International Journal of Advances in Scientific Research and Engineering (IJASRE), ISSN:2454-8006, DOI: 10.31695/IJASRE, [S. l.], v. 5, n. 9, p. 149–155, 2019. DOI: 10.31695/IJASRE.2019.33481. Disponível em: https://ijasre.net/index.php/ijasre/article/view/500. Acesso em: 4 may. 2024.