Analysis of Surface Morphology of CdTe Thin Film Using Digital Image Processing

Abstract

      This study aims to analyze the scanning electron microscope (SEM) images of cadmium telluride (CdTe) thin films. Image processing techniques were applied to the SEM images to measure the effect of film thickness and annealing process on the porosity, average and pore radius deviation distribution of the film. In addition, edge detection technique was used to identify grain boundaries.